Product Name:Conductive particle microscope
Product model: PZ-JTM-5040H
Product Introduction: Mainly used in the optoelectronic industry such as LCD, PDP, PCB, etc., providing the necessary testing equipment for their research and development and manufacturing. It has the functions of observing the distribution of OLB pressure bonded particles, foreign objects attached to the surface of the liquid crystal panel, scratches on the liquid crystal panel, measuring the size and quantity of conductive particles, etc

Product features:

Conductive particle microscopeIt is a high-precision and high-efficiency measuring instrument that combines imaging and visual functions. It has two sets of aiming systems for television imaging and visual optics, and is a measuring metallographic microscope that integrates optics, mechanics, electronics, computing, and imaging. This instrument is widely used in electronic components, precision molds, precision cutting tools, plastics, PCB processing, and other fields. It can not only be used for coordinate measurement, but also for microscopic magnification comparison measurement using an eyepiece standard reticle. It can measure the pitch, outer diameter, tooth angle, and other workpiece dimensions or external contours of threads, as well as observe the shape and defects of ACF conductive particles. In addition to being used for length and angle measurement, it can also be used as an observation microscope. It is one of the indispensable measuring and testing equipment in the mechanical, electronic, instrument, clock, light industry, and plastic industries, as well as in the measuring rooms, laboratories, and production workshops of universities, research institutes, and metrological verification departments.

1. Complies with ergonomic design principles for easy operation and measurement

2. One click pneumatic one handed quick movement operation on the workbench

3. Can achieve Z-axis autofocus

4. It has polarization and DIC detection functions

5. Adopting passive shock absorption devices to improve the accuracy and stability of the entire machine

6. Independently developed QMS3D-M software, high-definition imported 1/2 'color camera

7. The specific position of the measured workpiece can be found through a laser pointer, which can adapt to the measurement of complex workpieces

8. Can achieve height assisted measurement

9. The resolution of the Z-axis grating ruler is 0.1 μ m

10. Coaxial/bottom light measurement

11. Can be paired with a white light nano detection module to measure nanoscale thickness

Specification parameters: